Global Standards for the Microelectronics Industry
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Committees
- JC-10: Terms, Definitions, and Symbols (17) Apply JC-10: Terms, Definitions, and Symbols filter
- JC-11: Mechanical Standardization (611) Apply JC-11: Mechanical Standardization filter
- JC-13: Government Liaison (36) Apply JC-13: Government Liaison filter
- JC-14: Quality and Reliability of Solid State Products (155) Apply JC-14: Quality and Reliability of Solid State Products filter
- JC-15: Thermal Characterization Techniques for Semiconductor Packages (18) Apply JC-15: Thermal Characterization Techniques for Semiconductor Packages filter
- JC-16: Interface Technology (37) Apply JC-16: Interface Technology filter
- JC-22: Diodes and Thyristors (16) Apply JC-22: Diodes and Thyristors filter
- JC-25: Transistors (36) Apply JC-25: Transistors filter
- JC-40: Digital Logic (75) Apply JC-40: Digital Logic filter
- JC-42: Solid State Memories (154) Apply JC-42: Solid State Memories filter
- JC-45: DRAM Modules (125) Apply JC-45: DRAM Modules filter
- JC-63: Multiple Chip Packages (3) Apply JC-63: Multiple Chip Packages filter
- JC-64: Embedded Memory Storage & Removable Memory Cards (31) Apply JC-64: Embedded Memory Storage & Removable Memory Cards filter
- JC-65: RFID (1) Apply JC-65: RFID filter
- JC-70: Wide Bandgap Power Electronic Conversion Semiconductors (7) Apply JC-70: Wide Bandgap Power Electronic Conversion Semiconductors filter
Document Types
- JESD (JEDEC Standards) (404) Apply JESD (JEDEC Standards) filter
- MO- (Microelectronic Outlines) (345) Apply MO- (Microelectronic Outlines) filter
- MODULE (4, 4.2, 4.3, 4.4, 4.5, 4.6, 4.7 Modules) (119) Apply MODULE (4, 4.2, 4.3, 4.4, 4.5, 4.6, 4.7 Modules) filter
- JEP (JEDEC Publications) (113) Apply JEP (JEDEC Publications) filter
- TO- (Transistor Outlines) (53) Apply TO- (Transistor Outlines) filter
- CO- (Carrier Outlines) (36) Apply CO- (Carrier Outlines) filter
- MS- (Microelectronic Standards) (34) Apply MS- (Microelectronic Standards) filter
- SO- (Socket Outlines) (29) Apply SO- (Socket Outlines) filter
- SPD (4.1.2 Serial Presence Detect) (26) Apply SPD (4.1.2 Serial Presence Detect) filter
- SPP- (Standard Practices and Procedures) (25) Apply SPP- (Standard Practices and Procedures) filter
- DO- (Diode Outlines) (19) Apply DO- (Diode Outlines) filter
- SDRAM (3.11 Synchronous Dynamic Random Access Memory) (16) Apply SDRAM (3.11 Synchronous Dynamic Random Access Memory) filter
- DG- (Design Guideline) (16) Apply DG- (Design Guideline) filter
Technology Focus Areas
- Main Memory: DDR4 & DDR5 SDRAM
- Flash Memory: UFS, e.MMC, SSD, XFMD
- Mobile Memory: LPDDR, Wide I/O
- Memory Module Design File Registrations
- Memory Configurations: JESD21-C
- Registered Outlines: JEP95
- JEP30: Part Model Guidelines
- Lead-Free Manufacturing
- ESD: Electrostatic Discharge
- Wide Bandgap Power Semiconductors
